tree 3a8490ee5223b031643ab739a31b5ccae76a927b
parent 25876b7e867ac2c269d7aaef3ae07ac7580d67b7
author George Steed <george.steed@arm.com> 1673371534 +0000
committer James Zern <jzern@google.com> 1673667013 +0000

Add accumulator overflow test for masked SAD functions

Accumulator overflow is unlikely to be caught by purely random testing.
This is due to the fact that a sum of uniformly distributed random
numbers will only hit the max/min possible sum with exponentially
reducing likelihood as the problem size grows.

The maximum accumulator value for an 8-bit masked SAD occurs when doing
an absolute difference of 255 and 0. To ensure that we correctly handle
large accumulator values, this commit adds an explicit test case with
such values.

Change-Id: Ida4544e908d8416ebd9341abb8abe7111186ec3c