| commit | 7eaad70bf771e5e28f21863f6b316770f0779d24 | [log] [tgz] |
|---|---|---|
| author | Jingning Han <jingning@google.com> | Wed May 28 11:18:33 2014 -0700 |
| committer | Jingning Han <jingning@google.com> | Tue Jun 03 19:06:39 2014 -0700 |
| tree | c73bb2b5ba77f785ddc96b52d633b759611022cb | |
| parent | 74d47a8132288511be97a4d2326debd2fe0dc03b [diff] |
Enable unit test for partial 16x16 inverse 2D-DCT This commit enables unit test for SSSE3 16x16 inverse 2D-DCT with 10 non-zero coefficients. It includes a new test condition to cover the potential overflow issue due to extremely coarse quantization. Change-Id: I945e16f05dfbe19500f0da5f15990feba8e26d99