Partially support flip ADST in the reduced adapt-scan set
Support adaptive scan order update for flip ADST types of block
sizes 8x8 and below.
Change-Id: Ibcb3c9e9e0b8d397ef260a219b10a23e49758a63
diff --git a/av1/common/scan.h b/av1/common/scan.h
index 0d024a5..958bd50 100644
--- a/av1/common/scan.h
+++ b/av1/common/scan.h
@@ -35,7 +35,7 @@
#define REDUCED_SET 1
#define SUB_REGION_COUNT 1
#define SUB_FRAME_COUNT 1
-#define SIG_REGION 1
+#define SIG_REGION 0
#define USE_TOPOLOGICAL_SORT 0
#define USE_LIMIT_SCAN_DISTANCE 0
void av1_update_scan_count_facade(AV1_COMMON *cm, int mi_row,
@@ -98,7 +98,11 @@
if (tx_size > TX_32X16) return 0;
#if CONFIG_ADAPT_SCAN
#if REDUCED_SET
- return tx_type <= ADST_ADST;
+ const int txw = tx_size_wide[tx_size];
+ const int txh = tx_size_high[tx_size];
+
+ if (txw == 16 && txh == 16) return tx_type == DCT_DCT;
+ if (txw >= 16 || txh >= 16) return tx_type <= ADST_ADST;
#endif
#endif
return tx_type < IDTX;